SpringerLink (Online service), Kaushik, B. K., Dasgupta, S., & Singh, V. (2017). VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers. Springer Singapore : Imprint: Springer.
Chicago Style (17th ed.) CitationSpringerLink (Online service), Brajesh Kumar Kaushik, Sudeb Dasgupta, and Virendra Singh. VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers. Singapore: Springer Singapore : Imprint: Springer, 2017.
MLA (8th ed.) CitationSpringerLink (Online service), et al. VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers. Springer Singapore : Imprint: Springer, 2017.