VLSI Design and Test 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Kaushik, Brajesh Kumar (Επιμελητής έκδοσης), Dasgupta, Sudeb (Επιμελητής έκδοσης), Singh, Virendra (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2017.
• Σειρά: Communications in Computer and Information Science, 711
• Θέματα: Computer science.; Computer hardware.; Microprocessors.; Computer communication systems.; Computer Science.; Computer Hardware.; Processor Architectures.; Computer Communication Networks.
• Φυσική περιγραφή: XXI, 815 p. 486 illus. online resource.
• ISBN: 9789811074707
• ISSN: 1865-0929 ;

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.