VLSI Design and Test 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers /

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were orga...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Kaushik, Brajesh Kumar (Επιμελητής έκδοσης), Dasgupta, Sudeb (Επιμελητής έκδοσης), Singh, Virendra (Επιμελητής έκδοσης)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2017.
Σειρά:Communications in Computer and Information Science, 711
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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505 0 |a Digital design -- Analog/mixed signal -- VLSI testing -- Devices and technology -- VLSI architectures -- Emerging technologies and memory -- System design -- Low power design and test -- RF circuits -- Architecture and CAD -- Design verification. 
520 |a This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. 
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650 0 |a Computer hardware. 
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650 2 4 |a Computer Communication Networks. 
700 1 |a Kaushik, Brajesh Kumar.  |e editor. 
700 1 |a Dasgupta, Sudeb.  |e editor. 
700 1 |a Singh, Virendra.  |e editor. 
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830 0 |a Communications in Computer and Information Science,  |x 1865-0929 ;  |v 711 
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