Progress in Nanoscale Characterization and Manipulation

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Wang, Rongming (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Wang, Chen (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Zhang, Hongzhou (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Tao, Jing (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Bai, Xuedong (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Σειρά: Springer Tracts in Modern Physics, 272
• Θέματα: Nanoscale science.; Nanoscience.; Nanostructures.; Materials science.; Spectroscopy.; Microscopy.; Nanoscale Science and Technology.; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.
• Φυσική περιγραφή: VII, 508 p. 333 illus., 26 illus. in color. online resource.
• ISBN: 9789811304545
• ISSN: 0081-3869 ;
• DOI: 10.1007/978-981-13-0454-5

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.