Progress in Nanoscale Characterization and Manipulation

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, i...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Wang, Rongming (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Wang, Chen (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Zhang, Hongzhou (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Tao, Jing (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Bai, Xuedong (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2018.
Έκδοση:1st ed. 2018.
Σειρά:Springer Tracts in Modern Physics, 272
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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245 1 0 |a Progress in Nanoscale Characterization and Manipulation  |h [electronic resource] /  |c edited by Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai. 
250 |a 1st ed. 2018. 
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490 1 |a Springer Tracts in Modern Physics,  |x 0081-3869 ;  |v 272 
505 0 |a Electron/Ion Optics -- Scanning Electron Microscopy -- Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy (STEM) -- Spectroscopy -- Aberration Corrected Transmission Electron Microscopy and Its Applications -- In situ TEM: Theory and Applications -- Helium Ion Microscopy. 
520 |a This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. 
650 0 |a Nanoscale science. 
650 0 |a Nanoscience. 
650 0 |a Nanostructures. 
650 0 |a Materials science. 
650 0 |a Spectroscopy. 
650 0 |a Microscopy. 
650 1 4 |a Nanoscale Science and Technology.  |0 http://scigraph.springernature.com/things/product-market-codes/P25140 
650 2 4 |a Characterization and Evaluation of Materials.  |0 http://scigraph.springernature.com/things/product-market-codes/Z17000 
650 2 4 |a Spectroscopy and Microscopy.  |0 http://scigraph.springernature.com/things/product-market-codes/P31090 
700 1 |a Wang, Rongming.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Wang, Chen.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Zhang, Hongzhou.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Tao, Jing.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
700 1 |a Bai, Xuedong.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
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950 |a Physics and Astronomy (Springer-11651)