Progress in Nanoscale Characterization and Manipulation

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Wang, Rongming (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Wang, Chen (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Zhang, Hongzhou (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Tao, Jing (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Bai, Xuedong (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Σειρά: Springer Tracts in Modern Physics, 272
• Θέματα: Nanoscale science.; Nanoscience.; Nanostructures.; Materials science.; Spectroscopy.; Microscopy.; Nanoscale Science and Technology.; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, i...

Πίνακας περιεχομένων:

• Electron/Ion Optics
• Scanning Electron Microscopy
• Transmission Electron Microscopy
• Scanning Transmission Electron Microscopy (STEM)
• Spectroscopy
• Aberration Corrected Transmission Electron Microscopy and Its Applications
• In situ TEM: Theory and Applications
• Helium Ion Microscopy.