Παραπομπή σε μορφή APA (7η εκδ.)

Jayanthy, S., & Bhuvaneswari, M. (2019). Test Generation of Crosstalk Delay Faults in VLSI Circuits (1st ed. 2019.). Springer Singapore : Imprint: Springer. https://doi.org/10.1007/978-981-13-2493-2

Παραπομπή σε μορφή Chicago (17η εκδ.)

Jayanthy, S., και M.C Bhuvaneswari. Test Generation of Crosstalk Delay Faults in VLSI Circuits. 1st ed. 2019. Singapore: Springer Singapore : Imprint: Springer, 2019. https://doi.org/10.1007/978-981-13-2493-2.

Παραπομπή σε μορφή MLA (8th εκδ.)

Jayanthy, S., και M.C Bhuvaneswari. Test Generation of Crosstalk Delay Faults in VLSI Circuits. 1st ed. 2019. Springer Singapore : Imprint: Springer, 2019. https://doi.org/10.1007/978-981-13-2493-2.