Test Generation of Crosstalk Delay Faults in VLSI Circuits

• Κύριοι συγγραφείς: Jayanthy, S. (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Bhuvaneswari, M.C (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2019.
• Έκδοση: 1st ed. 2019.
• Θέματα: Electronic circuits.; Microprogramming .; Computer software-Reusability.; Logic design.; Circuits and Systems.; Control Structures and Microprogramming.; Performance and Reliability.; Logic Design.

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on cu...

Πίνακας περιεχομένων:

• Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects
• Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults
• Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm
• Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm
• Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization
• Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model
• Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits.