Novel methods for post-manufacturing and in-field testing of VLSI circuits/systems

• Main Author: Σισμάνογλου, Παναγιώτης
• Other Authors: Νικολός, Δημήτριος
• Format: Thesis
• Language: English
• Published: 2018
• Subjects: Test data compression; Dictionary based test data compression; Embedded testing techniques; IP cores; In-field testing; BIST; Συμπίεση δεδομένων δοκιμής; Τεχνικές ενσωματωμένου ελέγχου; Εργαστηριακός έλεγχος; 005.746

In this work, at first we analyze and evaluate, the already known test data compression schemes for post-manufacturing testing and the DFT mechanisms for the enhancement of in-field testing and circuit reliability. We propose a new dictionary based test data compression method for post-manufacturing...