Novel methods for post-manufacturing and in-field testing of VLSI circuits/systems
In this work, at first we analyze and evaluate, the already known test data compression schemes for post-manufacturing testing and the DFT mechanisms for the enhancement of in-field testing and circuit reliability. We propose a new dictionary based test data compression method for post-manufacturing...
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| Άλλοι συγγραφείς: | |
| Μορφή: | Thesis |
| Γλώσσα: | English |
| Έκδοση: |
2018
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| Διαθέσιμο Online: | http://hdl.handle.net/10889/10909 |
