Exploiting embedded DDR HW vulnerabilities to overpass SW security : rowhammer vulnerabilities and potent attacks under various architecture
The increasing capacity of main memory systems has driven to continuous DRAM scaling. The high DRAM density increases the coupling between adjacent DRAM cells, thereby exacerbating RAM failures and worsening the RAM cell reliability. This thesis investigates the reliability issue and security implic...
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Μορφή: | Thesis |
Γλώσσα: | English |
Έκδοση: |
2019
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Διαθέσιμο Online: | http://hdl.handle.net/10889/12624 |