Exploiting embedded DDR HW vulnerabilities to overpass SW security : rowhammer vulnerabilities and potent attacks under various architecture

The increasing capacity of main memory systems has driven to continuous DRAM scaling. The high DRAM density increases the coupling between adjacent DRAM cells, thereby exacerbating RAM failures and worsening the RAM cell reliability. This thesis investigates the reliability issue and security implic...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Pocero Fraile, Lidia
Άλλοι συγγραφείς: Κουφοπαύλου, Οδυσσέας
Μορφή: Thesis
Γλώσσα:English
Έκδοση: 2019
Θέματα:
Διαθέσιμο Online:http://hdl.handle.net/10889/12624