Digital holography for MEMS and microsystem metrology /

Approaching the topic of digital holography from the practical perspective of industrial inspection, "Digital Holography for MEMS and Microsystem Metrology" describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, desi...

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Άλλοι συγγραφείς: Asundi, Anand
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Chichester : Wiley, [2011]
Σειρά:Wiley microsystem and nanotechnology series.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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049 |a MAIN 
245 0 0 |a Digital holography for MEMS and microsystem metrology /  |c edited by Anand Asundi. 
264 1 |a Chichester :  |b Wiley,  |c [2011] 
264 4 |c ©2011 
300 |a 1 online resource (xxii, 205 pages). 
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347 |a data file  |2 rda 
380 |a Bibliography 
490 1 |a Microsystem and nanotechnology series 
505 0 |a Introduction / Anand Asundi -- Digital Reflection Holography and Applications / Vijay Raj Singh, Anand Asundi -- Digital Transmission Holography and Applications / Qu Weijuan -- Digital In-Line Holography and Applications / Taslima Khanam -- Other Applications / Caojin Yuan, Hongchen Zhai, Yu Yingjie, Jianlin Zhao -- Conclusion / Anand Asundi. 
520 |a Approaching the topic of digital holography from the practical perspective of industrial inspection, "Digital Holography for MEMS and Microsystem Metrology" describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the book's relevance and appeal to both researchers and engineers keen to evaluate the potential of digital holography for integration into their existing machines and processes. Addresses particle characterization where digital holography has proven capability for dynamic measurement of particles in 3D for sizing and shape characterization, with applications in microfluidics as well as crystallization and aerosol detection studies. Discusses digital reflection holography, digital transmission holography, digital in-line holography, and digital holographic tomography and applications. Covers other applications including micro-optical and diffractive optical systems and the testing of these components, and bio-imaging. 
504 |a Includes bibliographical references and index. 
650 0 |a Microelectromechanical systems  |x Measurement. 
650 0 |a Microelectronics  |x Measurement. 
650 0 |a Holographic testing. 
650 4 |a Holographic testing. 
650 4 |a Image processing  |x Digital techniques. 
650 4 |a Microelectromechanical systems  |x Measurement. 
650 4 |a Microelectronics  |x Measurement. 
650 7 |a TECHNOLOGY & ENGINEERING  |x Electronics  |x Digital.  |2 bisacsh 
650 7 |a TECHNOLOGY & ENGINEERING  |x Electronics  |x Microelectronics.  |2 bisacsh 
655 4 |a Electronic books. 
655 7 |a Electronic books.  |2 local 
700 1 |a Asundi, Anand. 
776 0 8 |i Print version:  |z 9786613177988  |w (DLC) 2011009635 
830 0 |a Wiley microsystem and nanotechnology series. 
856 4 0 |u https://doi.org/10.1002/9781119997290  |z Full Text via HEAL-Link 
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