Mechanical stress on the nanoscale : simulation, material systems and characterization techniques /

Mechanical stress on the nanoscale : simulation, material systems and characterization techniques /

Bibliographic Details
Other Authors: Hanbücken, Margrit, Muller, Pierre, 1950-, Wehrspohn, Ralf B.
Format: eBook
Language:English
Published: Weinheim : Wiley-VCH, 2011.
Subjects:
Semiconductors > Defects.
Semiconductors > Reliability.
TECHNOLOGY & ENGINEERING > Material Science.
Electronic books.
Online Access:Full Text via HEAL-Link
Description
Physical Description:1 online resource (380 pages)
Bibliography:Includes bibliographical references and index.
ISBN:9783527410668
352741066X
9783527639564
352763956X
9783527639540
3527639543
3527639551
9783527639557
9781283379496
128337949X
DOI:10.1002/9783527639540

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