Theory of intense beams of charged particles /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Άλλοι συγγραφείς: Syrovoy, Valeriy A.
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Amsterdam : Academic Press, 2011.
Σειρά:Advances in imaging and electron physics ; v. 166
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
LEADER 02173nam a2200397 4500
001 ocn773025561
003 OCoLC
005 20180501121948.0
006 m o d
007 cr |n|||||||||
008 110405s2011 ne a ob 001 0 eng d
040 |a MERUC  |b eng  |e pn  |c MERUC  |d OCLCQ  |d OCLCF  |d OCLCO  |d CDX  |d OPELS  |d OCLCQ  |d GrThAP 
019 |a 768569320 
020 |a 9780123813107  |q (hbk.) 
020 |a 0123813107  |q (hbk.) 
024 8 |a 9786613164018 
035 |a (OCoLC)773025561  |z (OCoLC)768569320 
050 4 |a QC793.5.E62  |b S97 2011eb 
082 0 4 |a 539.73  |2 22 
049 |a TEFA 
245 0 0 |a Theory of intense beams of charged particles /  |c edited by Valeriy A. Syrovoy ; translated by Mikhail A. Monastyrskiy. 
260 |a Amsterdam :  |b Academic Press,  |c 2011. 
300 |a 1 online resource (xviii, 734 pages) :  |b illustrations. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 0 |a Advances in imaging and electron physics ;  |v v. 166 
504 |a Includes bibliographical references and index. 
588 0 |a Print version record. 
520 |a Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians. 
650 0 |a Particle beams. 
650 7 |a Particle beams.  |2 fast  |0 (OCoLC)fst01054068 
655 4 |a Electronic books. 
700 1 |a Syrovoy, Valeriy A. 
776 0 8 |i Print version:  |z 9780123813107  |w (OCoLC)756272008 
856 4 0 |u https://www.sciencedirect.com/science/bookseries/10765670/166  |z Full Text via HEAL-Link