Neutron and X-Ray microscopy. Part 2 /

• Other Authors: Cremer, Ted
• Format: eBook
• Language: English
• Published: Amsterdam : Academic, 2012.
• Series: Advances in imaging and electron physics ; v. 173
• Subjects: Optoelectronic devices.; Optical data processing.; Electronic books.

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide...