Neutron and X-Ray microscopy. Part 2 /
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide...
| Άλλοι συγγραφείς: | Cremer, Ted |
|---|---|
| Μορφή: | Ηλ. βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
Amsterdam :
Academic,
2012.
|
| Σειρά: | Advances in imaging and electron physics ;
v. 173 |
| Θέματα: | |
| Διαθέσιμο Online: | Full Text via HEAL-Link |
Παρόμοια τεκμήρια
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Optics of charged particle analyzers /
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Advances in imaging and electron physics.
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Advances in imaging and electron physics.
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Advances in imaging and electron physics.
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Advances in imaging and electron physics.
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