Semiconductor laser engineering, reliability and diagnostics : a practical approach to high power and single mode devices /
"This reference book provides a fully integrated novel approach to the development of high power, single transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering (Part 1), reliability engineering (Part 2) and device diagnostics (Part 3) in the sam...
Κύριος συγγραφέας: | |
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Μορφή: | Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Chichester, West Sussex, U.K. :
John Wiley & Sons Inc.,
2013.
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Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |