Epperlein, P. W. (2013). Semiconductor laser engineering, reliability and diagnostics: A practical approach to high power and single mode devices. John Wiley & Sons Inc.. https://doi.org/10.1002/9781118481882
Chicago Style (17th ed.) CitationEpperlein, Peter W. Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices. Chichester, West Sussex, U.K.: John Wiley & Sons Inc., 2013. https://doi.org/10.1002/9781118481882.
MLA (8th ed.) CitationEpperlein, Peter W. Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices. John Wiley & Sons Inc., 2013. https://doi.org/10.1002/9781118481882.
Warning: These citations may not always be 100% accurate.