Epperlein, P. W. (2013). Semiconductor laser engineering, reliability and diagnostics: A practical approach to high power and single mode devices. John Wiley & Sons Inc.. https://doi.org/10.1002/9781118481882
Παραπομπή σε μορφή Chicago (17η εκδ.)Epperlein, Peter W. Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices. Chichester, West Sussex, U.K.: John Wiley & Sons Inc., 2013. https://doi.org/10.1002/9781118481882.
Παραπομπή σε μορφή MLA (8th εκδ.)Epperlein, Peter W. Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices. John Wiley & Sons Inc., 2013. https://doi.org/10.1002/9781118481882.
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