Cluster secondary ion mass spectrometry : principles and applications /

This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, e...

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Bibliographic Details
Main Author: Mahoney, Christine M., 1975-
Format: eBook
Language:English
Published: Hoboken, New Jersey : Wiley, [2013]
Series:Wiley-Interscience series on mass spectrometry.
Subjects:
Online Access:Full Text via HEAL-Link