Cluster secondary ion mass spectrometry : principles and applications /

• Κύριος συγγραφέας: Mahoney, Christine M., 1975-
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Hoboken, New Jersey : Wiley, [2013]
• Σειρά: Wiley-Interscience series on mass spectrometry.
• Θέματα: Secondary ion mass spectrometry.; Secondary electron emission.; Surfaces (Physics); SCIENCE > Chemistry > Analytic.; Electronic books.

This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, e...