Cluster secondary ion mass spectrometry : principles and applications /

• Κύριος συγγραφέας: Mahoney, Christine M., 1975-
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Hoboken, New Jersey : Wiley, [2013]
• Σειρά: Wiley-Interscience series on mass spectrometry.
• Θέματα: Secondary ion mass spectrometry.; Secondary electron emission.; Surfaces (Physics); SCIENCE > Chemistry > Analytic.; Electronic books.
• Φυσική περιγραφή: 1 online resource (350 pages).
• Βιβλιογραφία: Includes bibliographical references and index.
• ISBN: 9781118589335; 1118589335; 9781118589250; 1118589254; 0470886056; 9780470886052; 9781299475878; 1299475876; 9781118589243; 1118589246
• DOI: 10.1002/9781118589335

This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.