|
|
|
|
LEADER |
03238nam a2200709 4500 |
001 |
ocn841914445 |
003 |
OCoLC |
005 |
20170124071617.1 |
006 |
m o d |
007 |
cr |n||||||||| |
008 |
130418s2013 nju ob 001 0 eng d |
040 |
|
|
|a MHW
|b eng
|e pn
|c MHW
|d OCLCO
|d IDEBK
|d N$T
|d DG1
|d CUS
|d YDXCP
|d E7B
|d COO
|d NOC
|d OCLCO
|d RECBK
|d OCLCF
|d DEBSZ
|d OCLCQ
|d OCLCO
|d OCLCQ
|d GrThAP
|
019 |
|
|
|a 864915297
|
020 |
|
|
|a 9781118589335
|q (electronic bk.)
|
020 |
|
|
|a 1118589335
|q (electronic bk.)
|
020 |
|
|
|a 9781118589250
|q (electronic bk.)
|
020 |
|
|
|a 1118589254
|q (electronic bk.)
|
020 |
|
|
|a 0470886056
|
020 |
|
|
|a 9780470886052
|
020 |
|
|
|a 9781299475878
|q (MyiLibrary)
|
020 |
|
|
|a 1299475876
|q (MyiLibrary)
|
020 |
|
|
|a 9781118589243
|q (electronic bk.)
|
020 |
|
|
|a 1118589246
|q (electronic bk.)
|
020 |
|
|
|z 1118589254
|
020 |
|
|
|z 9780470886052
|
028 |
0 |
1 |
|a EB00063935
|b Recorded Books
|
029 |
1 |
|
|a AU@
|b 000051628931
|
029 |
1 |
|
|a CHBIS
|b 010026885
|
029 |
1 |
|
|a CHVBK
|b 306236850
|
029 |
1 |
|
|a DEBBG
|b BV041829197
|
029 |
1 |
|
|a DEBBG
|b BV041912822
|
029 |
1 |
|
|a DEBSZ
|b 431386226
|
029 |
1 |
|
|a DEBSZ
|b 449354415
|
029 |
1 |
|
|a DKDLA
|b 820120-katalog:000664086
|
029 |
1 |
|
|a NZ1
|b 15340513
|
035 |
|
|
|a (OCoLC)841914445
|z (OCoLC)864915297
|
050 |
|
4 |
|a QD96.S43 .M34 2013
|
072 |
|
7 |
|a SCI
|x 013010
|2 bisacsh
|
082 |
0 |
4 |
|a 543.65
|
049 |
|
|
|a MAIN
|
100 |
1 |
|
|a Mahoney, Christine M.,
|d 1975-
|
245 |
1 |
0 |
|a Cluster secondary ion mass spectrometry :
|b principles and applications /
|c edited by Christine M. Mahoney.
|
264 |
|
1 |
|a Hoboken, New Jersey :
|b Wiley,
|c [2013]
|
264 |
|
4 |
|c ©2013
|
300 |
|
|
|a 1 online resource (350 pages).
|
336 |
|
|
|a text
|b txt
|2 rdacontent
|
337 |
|
|
|a computer
|b c
|2 rdamedia
|
338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
490 |
1 |
|
|a Wiley series on mass spectrometry
|
588 |
0 |
|
|a Online resource; title from PDF title page (Wiley; viewed on May 28, 2013).
|
520 |
|
|
|a This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.
|
504 |
|
|
|a Includes bibliographical references and index.
|
650 |
|
0 |
|a Secondary ion mass spectrometry.
|
650 |
|
4 |
|a Secondary electron emission.
|
650 |
|
4 |
|a Surfaces (Physics)
|
650 |
|
7 |
|a SCIENCE
|x Chemistry
|x Analytic.
|2 bisacsh
|
650 |
|
7 |
|a Secondary ion mass spectrometry.
|2 fast
|0 (OCoLC)fst01110604
|
655 |
|
4 |
|a Electronic books.
|
776 |
0 |
8 |
|i Print version:
|a Mahoney, Christine M.
|t Cluster secondary ion mass spectrometry.
|d Hoboken, New Jersey : John Wiley, ©2013
|z 0470886056
|w (OCoLC)816563294
|
830 |
|
0 |
|a Wiley-Interscience series on mass spectrometry.
|
856 |
4 |
0 |
|u https://doi.org/10.1002/9781118589335
|z Full Text via HEAL-Link
|
994 |
|
|
|a 92
|b DG1
|