Cluster secondary ion mass spectrometry : principles and applications /

This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, e...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Mahoney, Christine M., 1975-
Μορφή: Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Hoboken, New Jersey : Wiley, [2013]
Σειρά:Wiley-Interscience series on mass spectrometry.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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049 |a MAIN 
100 1 |a Mahoney, Christine M.,  |d 1975- 
245 1 0 |a Cluster secondary ion mass spectrometry :  |b principles and applications /  |c edited by Christine M. Mahoney. 
264 1 |a Hoboken, New Jersey :  |b Wiley,  |c [2013] 
264 4 |c ©2013 
300 |a 1 online resource (350 pages). 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
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490 1 |a Wiley series on mass spectrometry 
588 0 |a Online resource; title from PDF title page (Wiley; viewed on May 28, 2013). 
520 |a This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods. 
504 |a Includes bibliographical references and index. 
650 0 |a Secondary ion mass spectrometry. 
650 4 |a Secondary electron emission. 
650 4 |a Surfaces (Physics) 
650 7 |a SCIENCE  |x Chemistry  |x Analytic.  |2 bisacsh 
650 7 |a Secondary ion mass spectrometry.  |2 fast  |0 (OCoLC)fst01110604 
655 4 |a Electronic books. 
776 0 8 |i Print version:  |a Mahoney, Christine M.  |t Cluster secondary ion mass spectrometry.  |d Hoboken, New Jersey : John Wiley, ©2013  |z 0470886056  |w (OCoLC)816563294 
830 0 |a Wiley-Interscience series on mass spectrometry. 
856 4 0 |u https://doi.org/10.1002/9781118589335  |z Full Text via HEAL-Link 
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