Cluster secondary ion mass spectrometry : principles and applications /
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, e...
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| Format: | eBook |
| Language: | English |
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Hoboken, New Jersey :
Wiley,
[2013]
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| Series: | Wiley-Interscience series on mass spectrometry.
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| Subjects: | |
| Online Access: | Full Text via HEAL-Link |