Scanning probe microscopy in industrial applications : nanomechanical characterization /

Scanning probe microscopy in industrial applications : nanomechanical characterization /

Bibliographic Details
Other Authors: Yablon, Dalia G., 1975- (Editor)
Format: eBook
Language:English
Published: Hoboken, New Jersey : Wiley, [2014]
Subjects:
Scanning probe microscopy > Industrial applications.
Materials > Microscopy.
Online Access:Full Text via HEAL-Link

Internet

Full Text via HEAL-Link

Similar Items