Yablon, D. G. (2014). Scanning probe microscopy in industrial applications: Nanomechanical characterization. Wiley. https://doi.org/10.1002/9781118723111
Chicago Style (17th ed.) CitationYablon, Dalia G. Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization. Hoboken, New Jersey: Wiley, 2014. https://doi.org/10.1002/9781118723111.
MLA (8th ed.) CitationYablon, Dalia G. Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization. Wiley, 2014. https://doi.org/10.1002/9781118723111.
Warning: These citations may not always be 100% accurate.