Παραπομπή σε μορφή APA (7η εκδ.)

Yablon, D. G. (2014). Scanning probe microscopy in industrial applications: Nanomechanical characterization. Wiley. https://doi.org/10.1002/9781118723111

Παραπομπή σε μορφή Chicago (17η εκδ.)

Yablon, Dalia G. Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization. Hoboken, New Jersey: Wiley, 2014. https://doi.org/10.1002/9781118723111.

Παραπομπή σε μορφή MLA (8th εκδ.)

Yablon, Dalia G. Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization. Wiley, 2014. https://doi.org/10.1002/9781118723111.