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03228nam a2200433 4500 |
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ocn864555241 |
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OCoLC |
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20170124070625.4 |
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m o d |
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cr cnu|||unuuu |
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131203s2014 nju ob 001 0 eng d |
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|a DG1
|b eng
|e rda
|e pn
|c DG1
|d CUS
|d OCLCO
|d YDXCP
|d OCLCO
|d OCLCQ
|d OCLCO
|d DG1
|d GrThAP
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| 020 |
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|a 9781118723111
|q (electronic bk.)
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| 020 |
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|a 1118723112
|q (electronic bk.)
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|z 9781118288238
|q (hardback)
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7 |
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|a 10.1002/9781118723111
|2 doi
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| 029 |
1 |
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|a AU@
|b 000052334816
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| 029 |
1 |
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|a NZ1
|b 15341823
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1 |
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|a GBVCP
|b 790210614
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1 |
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|a DEBBG
|b BV041829304
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|a (OCoLC)864555241
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4 |
|a QH212.S33
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| 082 |
0 |
4 |
|a 502.8/2
|2 23
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|a MAIN
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0 |
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|a Scanning probe microscopy in industrial applications :
|b nanomechanical characterization /
|c edited by Dalia G. Yablon.
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|a Hoboken, New Jersey :
|b Wiley,
|c [2014]
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| 300 |
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|a 1 online resource (xix, 347 pages)
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 505 |
0 |
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|a Overview of Atomic Force Microscopy / Dalia G Yablon -- Understanding the Tip-Sample Contact / Tevis D B Jacobs, C Mathew Mate, Kevin T Turner, Robert W Carpick -- Understanding Surface Forces Using Static and Dynamic Approach-Retraction Curves / Sudharsan Balasubramaniam, Daniel Kiracofe, Arvind Raman -- Phase Imaging / Dalia G Yablon, Greg Haugstad -- Dynamic Contact AFM Methods for Nanomechanical Properties / Donna C Hurley, Jason P Killgore -- Guide to Best Practices for AFM Users / Greg Haugstad -- Nanoindentation Measurements of Mechanical Properties of Very Thin Films and Nanostructured Materials at High Spatial Resolution / Steve J Bull -- Scanning Probe Microscopy for Critical Measurements in the Semiconductor Industry / Foucher Johann -- Atomic Force Microscopy of Polymers / Andy H Tsou, Dalia G Yablon -- Unraveling Links between Food Structure and Function with Probe Microscopy / A Patrick Gunning, Victor J Morris -- Microcantilever Sensors for Petrochemical Applications / Alan M Schilowitz -- Applications of Scanning Probe Methods in Cosmetic Science / Gustavo S Luengo, Anthony Galliano -- Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development / Matthew S Lamm -- Comparative Nanomechanical Study of Multiharmonic Force Microscopy and Nanoindentation on Low Dielectric Constant Materials / Katharine Walz, Robin King, Willi Volksen, Geraud Dubois, Jane Frommer, Kumar Virwani -- Nanomechanical Characterization of Biomaterial Surfaces / Klaus Wormuth, Greg Haugstad.
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| 504 |
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|a Includes bibliographical references and index.
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| 588 |
0 |
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|a Online resource; title from PDF title page (Wiley, viewed December 9, 2013).
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| 650 |
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|a Scanning probe microscopy
|x Industrial applications.
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| 650 |
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|a Materials
|x Microscopy.
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| 700 |
1 |
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|a Yablon, Dalia G.,
|d 1975-
|e editor.
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| 776 |
0 |
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|t Scanning probe microscopy for industrial applications.
|d Hoboken, New Jersey : John Wiley & Sons, [2013]
|z 9781118288238
|w (DLC) 2013009638
|w (OCoLC)841515696
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| 856 |
4 |
0 |
|u https://doi.org/10.1002/9781118723111
|z Full Text via HEAL-Link
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| 994 |
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|a 92
|b DG1
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