Scanning probe microscopy in industrial applications : nanomechanical characterization /
| Άλλοι συγγραφείς: | |
|---|---|
| Μορφή: | Ηλ. βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
Hoboken, New Jersey :
Wiley,
[2014]
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| Θέματα: | |
| Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- Overview of Atomic Force Microscopy / Dalia G Yablon
- Understanding the Tip-Sample Contact / Tevis D B Jacobs, C Mathew Mate, Kevin T Turner, Robert W Carpick
- Understanding Surface Forces Using Static and Dynamic Approach-Retraction Curves / Sudharsan Balasubramaniam, Daniel Kiracofe, Arvind Raman
- Phase Imaging / Dalia G Yablon, Greg Haugstad
- Dynamic Contact AFM Methods for Nanomechanical Properties / Donna C Hurley, Jason P Killgore
- Guide to Best Practices for AFM Users / Greg Haugstad
- Nanoindentation Measurements of Mechanical Properties of Very Thin Films and Nanostructured Materials at High Spatial Resolution / Steve J Bull
- Scanning Probe Microscopy for Critical Measurements in the Semiconductor Industry / Foucher Johann
- Atomic Force Microscopy of Polymers / Andy H Tsou, Dalia G Yablon
- Unraveling Links between Food Structure and Function with Probe Microscopy / A Patrick Gunning, Victor J Morris
- Microcantilever Sensors for Petrochemical Applications / Alan M Schilowitz
- Applications of Scanning Probe Methods in Cosmetic Science / Gustavo S Luengo, Anthony Galliano
- Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development / Matthew S Lamm
- Comparative Nanomechanical Study of Multiharmonic Force Microscopy and Nanoindentation on Low Dielectric Constant Materials / Katharine Walz, Robin King, Willi Volksen, Geraud Dubois, Jane Frommer, Kumar Virwani
- Nanomechanical Characterization of Biomaterial Surfaces / Klaus Wormuth, Greg Haugstad.
