Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

• Main Authors: Servín, Manuel (Author), Quiroga, J. Antonio (Juan Antonio) (Author), Padilla, J. Moisés (José Moisés) (Author)
• Format: eBook
• Language: English
• Published: Weinheim : Wiley-VCH, [2014]
• Edition: First edition.
• Subjects: Interferometry.; Diffraction patterns.; Optical measurements.; SCIENCE > Energy.; SCIENCE > Mechanics > General.; SCIENCE > Physics > General.; Interferometrie.; Beugungsfigur.; Electronic books.