APA (7th ed.) Citation

Servín, M., Quiroga, J. A., & Padilla, J. M. (2014). Fringe pattern analysis for optical metrology: Theory, algorithms, and applications (First edition.). Wiley-VCH. https://doi.org/10.1002/9783527681075

Chicago Style (17th ed.) Citation

Servín, Manuel, J. Antonio Quiroga, and J. Moisés Padilla. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications. First edition. Weinheim: Wiley-VCH, 2014. https://doi.org/10.1002/9783527681075.

MLA (8th ed.) Citation

Servín, Manuel, et al. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications. First edition. Wiley-VCH, 2014. https://doi.org/10.1002/9783527681075.