Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

Bibliographic Details
Main Authors: Servín, Manuel (Author), Quiroga, J. Antonio (Juan Antonio) (Author), Padilla, J. Moisés (José Moisés) (Author)
Format: eBook
Language:English
Published: Weinheim : Wiley-VCH, [2014]
Edition:First edition.
Subjects:
Interferometry.
Diffraction patterns.
Optical measurements.
SCIENCE > Energy.
SCIENCE > Mechanics > General.
SCIENCE > Physics > General.
Interferometrie.
Beugungsfigur.
Electronic books.
Online Access:Full Text via HEAL-Link
Description
Item Description:Edition statement from running title area.
Physical Description:1 online resource (xvi, 328 pages) : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:1306840880
9781306840880
9783527681082
3527681086
3527411526
9783527411528
9783527681105 (ePub)
3527681108 (ePub)
DOI:10.1002/9783527681075

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