Terrestrial radiation effects in ULSI devices and electronic systems /

• Κύριος συγγραφέας: Ibe, Eishi H.
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : John Wiley & Sons Inc., 2015.
• Θέματα: Electronic circuits > Effect of radiation on.; Integrated circuits > Ultra large scale integration > Reliability.; Integrated circuits > Effect of radiation on.; TECHNOLOGY & ENGINEERING > Mechanical.; Electronic books.