Terrestrial radiation effects in ULSI devices and electronic systems /

• Main Author: Ibe, Eishi H.
• Format: eBook
• Language: English
• Published: Singapore : John Wiley & Sons Inc., 2015.
• Subjects: Electronic circuits > Effect of radiation on.; Integrated circuits > Ultra large scale integration > Reliability.; Integrated circuits > Effect of radiation on.; TECHNOLOGY & ENGINEERING > Mechanical.; Electronic books.