Terrestrial radiation effects in ULSI devices and electronic systems /

• Κύριος συγγραφέας: Ibe, Eishi H.
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : John Wiley & Sons Inc., 2015.
• Θέματα: Electronic circuits > Effect of radiation on.; Integrated circuits > Ultra large scale integration > Reliability.; Integrated circuits > Effect of radiation on.; TECHNOLOGY & ENGINEERING > Mechanical.; Electronic books.
• Φυσική περιγραφή: 1 online resource.
• Βιβλιογραφία: Includes bibliographical references and index.
• ISBN: 9781118479315; 1118479319; 9781118479322; 1118479327; 9781118479308; 1118479300; 1118479297; 9781118479292
• DOI: 10.1002/9781118479308