Terrestrial radiation effects in ULSI devices and electronic systems /

Terrestrial radiation effects in ULSI devices and electronic systems /

Bibliographic Details
Main Author: Ibe, Eishi H.
Format: eBook
Language:English
Published: Singapore : John Wiley & Sons Inc., 2015.
Subjects:
Electronic circuits > Effect of radiation on.
Integrated circuits > Ultra large scale integration > Reliability.
Integrated circuits > Effect of radiation on.
TECHNOLOGY & ENGINEERING > Mechanical.
Electronic books.
Online Access:Full Text via HEAL-Link
Description
Physical Description:1 online resource.
Bibliography:Includes bibliographical references and index.
ISBN:9781118479315
1118479319
9781118479322
1118479327
9781118479308
1118479300
1118479297
9781118479292
DOI:10.1002/9781118479308

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