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02386nam a2200637 4500 |
| 001 |
ocn881318367 |
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OCoLC |
| 005 |
20170124071157.8 |
| 006 |
m o d |
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cr ||||||||||| |
| 008 |
140610s2015 si ob 001 0 eng |
| 010 |
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|a 2014022693
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| 040 |
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|a DLC
|b eng
|e rda
|e pn
|c DLC
|d DG1
|d N$T
|d UMI
|d E7B
|d YDXCP
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| 019 |
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|a 901504941
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|q (Adobe PDF)
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|a 1118479327
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|a 9781118479308
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|a 1118479300
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| 020 |
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|a 1118479297
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| 020 |
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|a 9781118479292
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|z 9781118479292
|q (cloth ;
|q alk. paper)
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| 029 |
1 |
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|a CHBIS
|b 010442230
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| 029 |
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| 035 |
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|a (OCoLC)881318367
|z (OCoLC)901504941
|z (OCoLC)901579623
|z (OCoLC)908281643
|
| 037 |
|
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|a CL0500000547
|b Safari Books Online
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| 042 |
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|a pcc
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| 050 |
0 |
0 |
|a TK7870.285
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| 072 |
|
7 |
|a TEC
|x 009070
|2 bisacsh
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| 082 |
0 |
0 |
|a 621.3815
|2 23
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| 049 |
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|a MAIN
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| 100 |
1 |
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|a Ibe, Eishi H.
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| 245 |
1 |
0 |
|a Terrestrial radiation effects in ULSI devices and electronic systems /
|c Eishi H. Ibe.
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| 264 |
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1 |
|a Singapore :
|b John Wiley & Sons Inc.,
|c 2015.
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| 300 |
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|a 1 online resource.
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| 336 |
|
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b n
|2 rdamedia
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| 338 |
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|a online resource
|b nc
|2 rdacarrier
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| 504 |
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|a Includes bibliographical references and index.
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| 588 |
0 |
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|a Print version record and CIP data provided by publisher.
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| 650 |
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|a Electronic circuits
|x Effect of radiation on.
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| 650 |
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|a Integrated circuits
|x Ultra large scale integration
|x Reliability.
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| 650 |
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|a Integrated circuits
|x Effect of radiation on.
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| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Mechanical.
|2 bisacsh
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| 655 |
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4 |
|a Electronic books.
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| 655 |
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0 |
|a Electronic books.
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| 776 |
0 |
8 |
|i Print version:
|a Ibe, Eishi H.
|t Terrestrial radiation effects in ULSI devices and electronic systems.
|d Singapore : John Wiley & Sons Inc., 2015
|z 9781118479292
|w (DLC) 2014022262
|
| 856 |
4 |
0 |
|u https://doi.org/10.1002/9781118479308
|z Full Text via HEAL-Link
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| 994 |
|
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|a 92
|b DG1
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