Terrestrial radiation effects in ULSI devices and electronic systems /

Terrestrial radiation effects in ULSI devices and electronic systems /

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Ibe, Eishi H.
Μορφή:	Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Singapore : John Wiley & Sons Inc., 2015.
Θέματα:	Electronic circuits > Effect of radiation on. Integrated circuits > Ultra large scale integration > Reliability. Integrated circuits > Effect of radiation on. TECHNOLOGY & ENGINEERING > Mechanical. Electronic books.
Διαθέσιμο Online:	Full Text via HEAL-Link

Παρόμοια τεκμήρια

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