Monte Carlo modeling for electron microscopy and microanalysis

• Main Author: Joy, David C.
• Format: Book
• Language: English
• Published: New York Oxford University Press 1995
• Series: Oxford series in optical and imaging sciences 9
• Subjects: Ηλεκτρονικό μικροσκόπιο; Μέθοδος Monte Carlo

Table of Contents:

• Includes references, index