An artificial intelligence approach to test generation
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Boston
Kluwer Academic Publishers
c1987
|
| Series: | Kluwer International Series in Engineering and Computer Science
|
| Subjects: |
ΒΚΠ - Πατρα: ALFf
| Call Number: |
621.395 SIN |
|---|---|
| Copy 1 | Available |
