Built-in test for VLSI: preudorandom techniques

• Main Authors: Bardell, Paul H. (Author), McAnney, William H. (Author), Savir, Jacob (Author)
• Format: Book
• Language: English
• Published: New York John Wiley & Sons c1987
• Subjects: INTEGRATED CIRCUITS; VLSI
• Item Description: Βιβλιογραφία : σσ. 339-345
• Physical Description: xiii, 354p. fig.
• ISBN: 0 471 62463 2