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|a Βιβλιοθήκη ΕΑΙΤΥ
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|a eng
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|a Built-in test for VLSI: preudorandom techniques
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|a New York
|b John Wiley & Sons
|c c1987
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|a xiii, 354p.
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|a Βιβλιογραφία : σσ. 339-345
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|a Bardell, Paul H.
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|a McAnney, William H.
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|a Savir, Jacob
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|x Μεταφορά από Τμ. Μηχανικών ΗΥ & Πληροφορικής
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