Built-in test for VLSI: preudorandom techniques

Built-in test for VLSI: preudorandom techniques

Bibliographic Details
Main Authors: Bardell, Paul H. (Author), McAnney, William H. (Author), Savir, Jacob (Author)
Format: Book
Language:English
Published: New York John Wiley & Sons c1987
Subjects:
INTEGRATED CIRCUITS
VLSI

ΒΚΠ - Πατρα: ALFg

Holdings details from ΒΚΠ - Πατρα: ALFg
Call Number: 621.395 BAR
Copy 1 Available

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