Built-in test for VLSI: preudorandom techniques

Built-in test for VLSI: preudorandom techniques

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Bardell, Paul H. (Συγγραφέας), McAnney, William H. (Συγγραφέας), Savir, Jacob (Συγγραφέας)
Μορφή:	Βιβλίο
Γλώσσα:	English
Έκδοση:	New York John Wiley & Sons c1987
Θέματα:	INTEGRATED CIRCUITS VLSI

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