Hierarchical Modeling for VLSI Circuit Testing

• Other Authors: Bhattacharya, Debashis, Hayes, John P.
• Format: Book
• Language: English
• Published: Boston Kluwer Academic Publishers 1990
• Subjects: ΕΠΕΑΕΚ; VLSI; INTEGRATED CIRCUITS; COMPUTER SIMULATION
• Physical Description: x,159p.:fig.
• ISBN: 0 7923 9058 X