Static Crosstalk-Noise Analysis For Deep Sub-Micron Digital Designs /

As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditionally, static timing analysis tools have ignored cro...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Chen, Pinhong (Συγγραφέας), Kirkpatrick, Desmond A. (Συγγραφέας), Keutzer, Kurt (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Boston, MA : Springer US, 2004.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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003 DE-He213
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008 100301s2004 xxu| s |||| 0|eng d
020 |a 9781402080920  |9 978-1-4020-8092-0 
024 7 |a 10.1007/b117251  |2 doi 
040 |d GrThAP 
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072 7 |a TEC008010  |2 bisacsh 
082 0 4 |a 621.3815  |2 23 
100 1 |a Chen, Pinhong.  |e author. 
245 1 0 |a Static Crosstalk-Noise Analysis  |h [electronic resource] :  |b For Deep Sub-Micron Digital Designs /  |c by Pinhong Chen, Desmond A. Kirkpatrick, Kurt Keutzer. 
264 1 |a Boston, MA :  |b Springer US,  |c 2004. 
300 |a XVIII, 113 p.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
505 0 |a Miller Factor Computation for Coupling Delay -- Convergence of Switching Window Computation -- Speeding-Up Switching Window Computation -- Refinement of Switching Windows -- Functional Crosstalk Analysis -- Conclusions. 
520 |a As the feature size decreases in deep sub-micron designs, coupling capacitance becomes the dominant factor in total capacitance. The resulting crosstalk noise may be responsible for signal integrity issues and significant timing variation. Traditionally, static timing analysis tools have ignored cross coupling effects between wires altogether. Newer tools simply approximate the coupling capacitance by a 2X Miller factor in order to compute the worst case delay. The latter approach not only reduces delay calculation accuracy, but can also be shown to underestimate the delay in certain scenarios. This book describes accurate but conservative methods for computing delay variation due to coupling. Furthermore, most of these methods are computationally efficient enough to be employed in a static timing analysis tool for complex integrated digital circuits. To achieve accuracy, a more accurate computation of the Miller factor is derived. To achieve both computational efficiency and accuracy, a variety of mechanisms for pruning the search space are detailed, including: -Spatial pruning - reducing aggressors to those in physical proximity, -Electrical pruning - reducing aggressors by electrical strength, -Temporal pruning - reducing aggressors using timing windows, -Functional pruning - reducing aggressors by Boolean functional analysis. 
650 0 |a Engineering. 
650 0 |a Computer-aided engineering. 
650 0 |a Electrical engineering. 
650 0 |a Electronic circuits. 
650 1 4 |a Engineering. 
650 2 4 |a Circuits and Systems. 
650 2 4 |a Electrical Engineering. 
650 2 4 |a Computer-Aided Engineering (CAD, CAE) and Design. 
700 1 |a Kirkpatrick, Desmond A.  |e author. 
700 1 |a Keutzer, Kurt.  |e author. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9781402080913 
856 4 0 |u http://dx.doi.org/10.1007/b117251  |z Full Text via HEAL-Link 
912 |a ZDB-2-ENG 
912 |a ZDB-2-BAE 
950 |a Engineering (Springer-11647)