Scanning Electron Microscopy and X-Ray Microanalysis
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD)...
Κύριοι συγγραφείς: | Goldstein, Joseph I. (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Newbury, Dale E. (http://id.loc.gov/vocabulary/relators/aut), Michael, Joseph R. (http://id.loc.gov/vocabulary/relators/aut), Ritchie, Nicholas W.M (http://id.loc.gov/vocabulary/relators/aut), Scott, John Henry J. (http://id.loc.gov/vocabulary/relators/aut), Joy, David C. (http://id.loc.gov/vocabulary/relators/aut) |
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Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
New York, NY :
Springer New York : Imprint: Springer,
2018.
|
Έκδοση: | 4th ed. 2018. |
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
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