Scanning Electron Microscopy and X-Ray Microanalysis

• Κύριοι συγγραφείς: Goldstein, Joseph I. (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Newbury, Dale E. (http://id.loc.gov/vocabulary/relators/aut), Michael, Joseph R. (http://id.loc.gov/vocabulary/relators/aut), Ritchie, Nicholas W.M (http://id.loc.gov/vocabulary/relators/aut), Scott, John Henry J. (http://id.loc.gov/vocabulary/relators/aut), Joy, David C. (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York : Imprint: Springer, 2018.
• Έκδοση: 4th ed. 2018.
• Θέματα: Materials science.; Spectroscopy.; Microscopy.; Physical measurements.; Measurement .; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.; Biological Microscopy.; Spectroscopy/Spectrometry.; Measurement Science and Instrumentation.

This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD)...

Πίνακας περιεχομένων:

• Preface
• Scanning Electron Microscopy and Associated Techniques: Overview
• Electron Beam - Specimen Interactions: Interaction Volume
• Backscattered Electrons
• Secondary Electrons
• X-rays
• SEM Instrumentation
• Image Formation
• SEM Image Interpretation
• The Visibility of Features in SEM Images
• Image Defects
• High resolution imaging
• Low Beam Energy SEM
• Variable Pressure Scanning Electron Microscopy (VPSEM)
• ImageJ and Fiji
• SEM Imaging checklist
• SEM Case Studies
• Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters
• DTSA-II EDS Software
• Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry
• Quantitative Analysis: from k-ratio to Composition
• Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step
• Trace Analysis by SEM/EDS
• Low Beam Energy X-ray Microanalysis
• Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles
• Compositional Mapping
• Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM)
• Energy Dispersive X-ray Microanalysis Checklist
• X-ray Microanalysis Case Studies
• Cathodoluminescence
• Characterizing crystalline materials in the SEM
• Focused Ion Beam Applications in the SEM laboratory
• Ion Beam Microscopy
• Appendix - A Database of Electron-Solid Interactions
• Index.