Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Sadewasser, Sascha (Editor, http://id.loc.gov/vocabulary/relators/edt), Glatzel, Thilo (Editor, http://id.loc.gov/vocabulary/relators/edt)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Edition: 1st ed. 2018.
• Series: Springer Series in Surface Sciences, 65
• Subjects: Spectroscopy.; Microscopy.; Materials-Surfaces.; Thin films.; Nanotechnology.; Materials science.; Physical measurements.; Measurement .; Spectroscopy and Microscopy.; Surfaces and Interfaces, Thin Films.; Nanotechnology and Microengineering.; Characterization and Evaluation of Materials.; Measurement Science and Instrumentation.
• Physical Description: XXIV, 521 p. 234 illus., 194 illus. in color. online resource.
• ISBN: 9783319756875
• ISSN: 0931-5195 ;
• DOI: 10.1007/978-3-319-75687-5

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.