Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Sadewasser, Sascha (Editor, http://id.loc.gov/vocabulary/relators/edt), Glatzel, Thilo (Editor, http://id.loc.gov/vocabulary/relators/edt)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Edition: 1st ed. 2018.
• Series: Springer Series in Surface Sciences, 65
• Subjects: Spectroscopy.; Microscopy.; Materials-Surfaces.; Thin films.; Nanotechnology.; Materials science.; Physical measurements.; Measurement .; Spectroscopy and Microscopy.; Surfaces and Interfaces, Thin Films.; Nanotechnology and Microengineering.; Characterization and Evaluation of Materials.; Measurement Science and Instrumentation.

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular...