Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments /

• Main Authors: Xie, Hui (Author), Onal, Cagdas (Author), Régnier, Stéphane (Author), Sitti, Metin (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2012.
• Series: Springer Tracts in Advanced Robotics, 71
• Subjects: Engineering.; Artificial intelligence.; Nanotechnology.; Robotics.; Automation.; Robotics and Automation.; Artificial Intelligence (incl. Robotics).; Nanotechnology and Microengineering.

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-m...

Table of Contents:

• Descriptions and challenges of AFM based nanorobotic systems
• Instrumentation issues of an AFM based nanorobotic system
• Nanomechanics of AFM based nanomanipulation
• Teleoperation based AFM manipulation control
• Automated control of AFM based nanomanipulation
• Applications of AFM based nanorobotic systems.