VLSI Design and Test 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Kaushik, Brajesh Kumar (Editor), Dasgupta, Sudeb (Editor), Singh, Virendra (Editor)
• Format: Electronic eBook
• Language: English
• Published: Singapore : Springer Singapore : Imprint: Springer, 2017.
• Series: Communications in Computer and Information Science, 711
• Subjects: Computer science.; Computer hardware.; Microprocessors.; Computer communication systems.; Computer Science.; Computer Hardware.; Processor Architectures.; Computer Communication Networks.

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were orga...

Table of Contents:

• Digital design
• Analog/mixed signal
• VLSI testing
• Devices and technology
• VLSI architectures
• Emerging technologies and memory
• System design
• Low power design and test
• RF circuits
• Architecture and CAD
• Design verification.